The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Dec. 02, 2010
David Arbel, Michmoret, IL;
Amit Gefner, Ramat-Gan, IL;
Eran Gery, Modiin, IL;
Ehud Hoggeg, Ashdod, IL;
Beery Holstein, Herzelliya, IL;
Alexander Rekhter, Ashdod, IL;
David Arbel, Michmoret, IL;
Amit Gefner, Ramat-Gan, IL;
Eran Gery, Modiin, IL;
Ehud Hoggeg, Ashdod, IL;
Beery Holstein, Herzelliya, IL;
Alexander Rekhter, Ashdod, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system, and computer program product for reversibly instrumenting a computer software application is described. The method may comprise creating a map indicating a plurality of locations of application instruction sections within instructions of a computer software application. The method may further comprise inserting a plurality of instrumentation sections into the computer software application instructions. The method may also comprise updating the map to indicate the locations of the instrumentation sections within the computer software application instructions, where the indications in the map of the locations of the instrumentation sections are distinguishable from the indications in the map of the locations of the application instruction sections. The method may additionally comprise updating the map to indicate a change in any of the locations of any of the application instruction sections within the computer software application instructions subsequent to inserting the instrumentation sections.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile