The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Dec. 10, 2012
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/22 (2006.01); G11C 29/16 (2006.01); G11C 29/54 (2006.01); G11C 11/41 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/16 (2013.01); G11C 11/41 (2013.01); G11C 2029/0401 (2013.01);
Abstract
A programmable Built In Self Test (pBIST) system used to test embedded memories where the memories under test are incorporated in a plurality of sub chips not integrated with the pBIST module. Test data comparison is performed in a distributed data logging architecture to minimize the number of interconnections between the distributed data loggers and the pBIST.