The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Dec. 28, 2011
Applicants:

David Meiri, Cambridge, MA (US);

Dan Arnon, Somerville, MA (US);

Benjamin W. Yoder, Westborough, MA (US);

Mark J. Halstead, Holliston, MA (US);

Assaf Natanzon, Tel Aviv, IL;

Inventors:

David Meiri, Cambridge, MA (US);

Dan Arnon, Somerville, MA (US);

Benjamin W. Yoder, Westborough, MA (US);

Mark J. Halstead, Holliston, MA (US);

Assaf Natanzon, Tel Aviv, IL;

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01); G06F 11/20 (2006.01); G06F 3/06 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2056 (2013.01); G06F 11/2074 (2013.01); G06F 11/2066 (2013.01); G06F 3/065 (2013.01); G06F 11/1471 (2013.01); G06F 2201/855 (2013.01);
Abstract

A method, system, and computer program product for ordering a plurality of data IO captured at a primary site to be applied at a secondary site, comprising removing the one or more extent level portions from the captured data IO, determining if the one or more extent level portions are time sequenced to overwrite a portion of data of the data IO, based on a determination that the portion data is to be overwritten, removing the overwritten portion of data from the plurality of the data IO and ordering the one or more extent level portions to be applied at the secondary site before the captured data IO.


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