The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Apr. 10, 2012
Derek Shiell, Los Angeles, CA (US);
Jing Xiao, Cupertino, CA (US);
Derek Shiell, Los Angeles, CA (US);
Jing Xiao, Cupertino, CA (US);
Seiko Epson Corporation, Tokyo, JP;
Abstract
A specific item within an item class is identified by defining sets of descriptor data from a training library. The collected descriptor data is grouped and organized into a hierarchical tree, where each leaf node is defined by relations between corresponding parts of the descriptor data. Registrable sets of descriptor data are then identified from a collection of registrable samples. The registrable sets of descriptors are sorted into the hierarchical tree. When an input sample to be identified is received, a test set of descriptor data is generated from the input sample. The test set is then sorted into the hierarchical tree. Each leaf node that receives a part of the test set provides a vote for the registered samples it contains. The registered sample with the most votes is deemed a match for the input sample.