The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Dec. 07, 2010
Applicants:

Thilo Boehm, Heidelberg, DE;

Martin Mueller, Walldorf, DE;

Maic Wintel, Walldorf, DE;

Inventors:

Thilo Boehm, Heidelberg, DE;

Martin Mueller, Walldorf, DE;

Maic Wintel, Walldorf, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30383 (2013.01);
Abstract

The subject matter disclosed herein provides, methods and apparatus, including computer program products for the management of a view of a data structure. In one aspect, there is provided a method that may include generating a view of a data structure. The data structure and the view may include a plurality of nodes and at least one association. This method may further include determining, at run time, whether the generated view is invalid based on an indicator. The indicator may represent whether a change has occurred to a system including the view. This method may further include deleting, at run time, the view based on the results of the determining. Related apparatus, systems, techniques and articles are also described.


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