The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Mar. 23, 2010
Applicants:

Shinichi Ando, Tokyo, JP;

Kunihiko Sadamasa, Tokyo, JP;

Inventors:

Shinichi Ando, Tokyo, JP;

Kunihiko Sadamasa, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
Abstract

A language analysis apparatus of the invention includes division rules, each of which is classified into one of levels according to the degree of risk of causing analysis accuracy problems when applied; a division point candidate generation unitwhich, when a character string whose length is greater than the predetermined maximum input length is input, generates division point candidates for the input character string by applying the division rules sequentially one by one in the ascending order of the level of risk of causing problems; a division point adjustment unitwhich, when the length of a division unit candidate obtained by the division point candidate generated by the division point candidate generation unitis less than the maximum input length, selects a combination of division points from among the division point candidates obtained by applying division rules of the same level while ensuring that each division unit is not greater in length than the maximum input length; and a division unitwhich divides an input character string at the division point determined by the division point adjustment unit.


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