The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Aug. 17, 2011
Angela Da Silva, Danville, CA (US);
Horace Hines, San Jose, CA (US);
Lingxiong Shao, Saratoga, CA (US);
Hongjie Liang, San Jose, CA (US);
Anna Exner, Aachen, DE;
Andreas Goedicke, Aachen, DE;
Angela Da Silva, Danville, CA (US);
Horace Hines, San Jose, CA (US);
Lingxiong Shao, Saratoga, CA (US);
Hongjie Liang, San Jose, CA (US);
Anna Exner, Aachen, DE;
Andreas Goedicke, Aachen, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
An anatomical image data set and an emission image data set are acquired for a subject. An attenuation map is generated from the anatomical image data set. The emission image data set is reconstructed to generate an emission image. The reconstructing includes correcting for attenuation of emission radiation in the subject using the attenuation map. A value is calculated for a quality assurance (QA) metric quantifying alignment of the attenuation map with the emission image. The emission image is displayed or printed together with the calculated quality assurance metric. In some embodiments, prior to the reconstructing the attenuation map is registered with the emission image data set by performing a global rigid registration followed by a local non-rigid registration of a region of interest.