The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Sep. 24, 2011
Applicants:

Michael J. Mcfadden, San Antonio, TX (US);

Jeffrey L. Boehme, San Antonio, TX (US);

Inventors:

Michael J. McFadden, San Antonio, TX (US);

Jeffrey L. Boehme, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01); G01N 23/04 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/046 (2013.01); A61B 6/027 (2013.01); A61B 6/025 (2013.01);
Abstract

An x-ray imaging system and method for providing three-dimensional data representing the contents of an object. An x-ray source and x-ray screen are used to acquire multiple x-ray images of the object from different perspectives. The different perspectives are obtained by placing the x-ray source at one end of a moveable arm. These images are processed by back-projecting each perspective image at known distances between the object and the x-ray source, and superimposing the back-projected images at each distance, thereby providing a set of image slices of the object along the z-axis.


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