The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Nov. 02, 2011
Hao Wu, Beijing, CN;
Hongjun Yu, Beijing, CN;
Xiuqiang Zhao, Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Abstract
The embodiments of the present disclosure provide a WWAN test method and a test system related to the communication field, which is suitable for the product research and development stage and can derive a quantitative data relationship between a NFS test result and an OTA test result. The WWAN test method comprises: measuring a power value of noises, denoted by D(NFS), received by an antenna of a terminal to be tested in a NFS test manner; measuring a power attenuation value, denoted by D-sense, of a path from a WWAN module to the antenna of the terminal; obtaining an antenna efficiency value, denoted by AE, of the terminal; and obtaining a TIS value of an OTA test result by TIS=D(NFS)+D-sense−AE. The embodiments of the present disclosure can be used in the NFS test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile