The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Jan. 30, 2013
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Fumito Takemoto, Ashigarakami-gun, JP;
Yoshihiko Ishii, Ashigarakami-gun, JP;
Koichi Tozuka, Ashigarakami-gun, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00045 (2013.01); H04N 1/00015 (2013.01); H04N 1/00031 (2013.01); H04N 1/00053 (2013.01); H04N 1/00058 (2013.01); H04N 1/00071 (2013.01);
Abstract
An evaluation chart has test patterns, a first code mark, and a second code mark. The evaluation chart is electronically read at one time to obtain first code information that specifies measuring conditions for the evaluation chart and second code information that specifies image forming conditions for the evaluation chart. Quantized information of the test patterns that is measured under the measuring conditions is associated with the image forming conditions.