The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

May. 02, 2013
Applicant:

Lexmark International, Inc., Lexington, KY (US);

Inventors:

Fei Chen, Lexington, KY (US);

Brent Steven Dupree, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); H04N 1/028 (2006.01);
U.S. Cl.
CPC ...
H04N 1/0281 (2013.01);
Abstract

A scanning system includes a scanning member having at least one reflective surface and at least one light source for emitting at least one light beam to be incident on the at least one reflective surface of the scanning member during a scanning operation. At least one curved synchronization mirror deflects and focuses at least a portion of the at least one light beam that is deflected by the scanning member to indicate at least one of a start and an end of a scan line operation of the scanning operation. A sensor receives the at least one light beam deflected and focused by the at least one curved synchronization mirror.


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