The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Dec. 22, 2011
Clark Alexander Bendall, Syracuse, NY (US);
Kevin George Harding, Niskayuna, NY (US);
Thomas Karpen, Skaneateles, NY (US);
Guiju Song, Shanghai, CN;
LI Tao, ShangHai, CN;
Clark Alexander Bendall, Syracuse, NY (US);
Kevin George Harding, Niskayuna, NY (US);
Thomas Karpen, Skaneateles, NY (US);
Guiju Song, Shanghai, CN;
Li Tao, ShangHai, CN;
General Electric Company, Schenectady, NY (US);
Abstract
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.