The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Mar. 23, 2012
Applicants:

Alfred Feitisch, Los Gatos, CA (US);

Xiang Liu, Rancho Cucamonga, CA (US);

Hsu-hung Huang, Rancho Cucamonga, CA (US);

Wenhai Ji, Fontana, CA (US);

Richard Cline, Missouri City, TX (US);

Inventors:

Alfred Feitisch, Los Gatos, CA (US);

Xiang Liu, Rancho Cucamonga, CA (US);

Hsu-Hung Huang, Rancho Cucamonga, CA (US);

Wenhai Ji, Fontana, CA (US);

Richard Cline, Missouri City, TX (US);

Assignee:

SpectraSensors, Inc., Rancho Cucamonga, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/27 (2006.01); G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/3504 (2013.01);
Abstract

Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.


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