The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Nov. 07, 2012
The George Washington University, Washington, DC (US);
The United States of America As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Daniel Bivolaru, Hampton, VA (US);
Andrew D. Cutler, Yorktown, VA (US);
Paul M. Danehy, Newport News, VA (US);
The United States of America as Represented by NASA, Washington, DC (US);
The George Washington University, Washington, DC (US);
Other;
Abstract
A system that simultaneously measures the translational temperature, bulk velocity, and density in gases by collecting, referencing, and analyzing nanosecond time-scale Rayleigh scattered light from molecules is described. A narrow-band pulsed laser source is used to probe two largely separated measurement locations, one of which is used for reference. The elastically scattered photons containing information from both measurement locations are collected at the same time and analyzed spectrally using a planar Fabry-Perot interferometer. A practical means of referencing the measurement of velocity using the laser frequency, and the density and temperature using the information from the reference measurement location maintained at constant properties is provided.