The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Jun. 04, 2013
Applicant:

Lightel Technologies, Inc., Renton, WA (US);

Inventors:

Ge Zhou, Renton, WA (US);

Shangyuan Huang, Kent, WA (US);

Assignee:

Lightel Technologies, Inc., Renton, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/30 (2013.01);
Abstract

A fitting tip of fiber-optic connector endface inspection microscope for inspecting angled connector endfaces includes a relay lens fixed inside its internal channel and is designed such that when it is received in an intended connector adapter and mounted to the inspection microscope, the normal line to the connector endface forms an acute angle γ with the optical axis of the relay lens; the ray exiting from the relay lens and conjugate to the ray along the normal line is aligned with the optical axis of the inspection microscope; and as a result the connector endface is imaged on an imaging plane within the focusing adjustment range of the inspection microscope. The best image of the connector endface is obtained when the angle γ is half of the inclined angle of the angled connector endface.


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