The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Aug. 29, 2012
Joel S. Armstrong-muntner, San Mateo, CA (US);
James J. Dudley, Sunnyvale, CA (US);
Richard Ruh, Monte Sereno, CA (US);
Anant Rai, San Jose, CA (US);
Joel S. Armstrong-Muntner, San Mateo, CA (US);
James J. Dudley, Sunnyvale, CA (US);
Richard Ruh, Monte Sereno, CA (US);
Anant Rai, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A lens testing system may have a test pattern source that generates a test pattern of light. A lens may have a lens surface that reflects the test pattern of light. A digital camera system may capture an image of the reflected test pattern of light. Computing equipment may perform image processing operations to evaluate the captured image of the reflected test pattern. The test pattern may contain a known pattern of test elements such as a rectangular array of spots or test elements of other configurations. During image processing operations, the computing equipment may analyze the reflected version of the spots or other test elements to measure characteristics of the lens such as radius of curvature, whether the lens contains flat regions, pits, or bumps, lens placement in a support structure, and other lens performance data. The computing equipment may compare the measured lens data to predetermined criteria.