The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Oct. 01, 2008
Tetsuro Aikawa, Yokohama, JP;
Yoshinori Satoh, Kawasaki, JP;
Makoto Ochiai, Yokohama, JP;
Tatsuya Oodake, Zushi, JP;
Hiroyuki Adachi, Shinagawa-ku, JP;
Yasuhiro Yuguchi, Yokohama, JP;
Junichi Takabayashi, Yokohama, JP;
Tetsuro Aikawa, Yokohama, JP;
Yoshinori Satoh, Kawasaki, JP;
Makoto Ochiai, Yokohama, JP;
Tatsuya Oodake, Zushi, JP;
Hiroyuki Adachi, Shinagawa-ku, JP;
Yasuhiro Yuguchi, Yokohama, JP;
Junichi Takabayashi, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
The present invention includes a camera which takes an image of a camera or an inspection target; a device which estimates the movement of the inspection target; a device which generates a high resolution image having a higher resolution than the pixel resolution of a video image taken by the camera from the video image taken by the camera; a device which evaluates the quality of the high resolution image generated by the generation device; and a device which presents an inspector who visually inspects the inspection target with the high resolution image together with the quality evaluation result of the high resolution image. The present invention can improve the reliability of inspection by use of the high resolution image as well as can reduce the inspection time, and further can guarantee the reliability of the inspection using a high resolution image.