The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Sep. 24, 2012
Applicants:

Daniel Y. Chiew, Marion, IA (US);

Roger L. Yum, Marion, IA (US);

Travis S. Vanderkamp, Marion, IA (US);

Alexander D. Reid, Tualatin, OR (US);

Carlo L. Tiana, Portland, OR (US);

Weston J. Lahr, Sherwood, OR (US);

Inventors:

Daniel Y. Chiew, Marion, IA (US);

Roger L. Yum, Marion, IA (US);

Travis S. Vanderkamp, Marion, IA (US);

Alexander D. Reid, Tualatin, OR (US);

Carlo L. Tiana, Portland, OR (US);

Weston J. Lahr, Sherwood, OR (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G01C 21/00 (2006.01); G06F 7/70 (2006.01);
U.S. Cl.
CPC ...
Abstract

Present novel and non-trivial system, device, and method for combining image data received from two or more vision systems are disclosed. A system may be comprised of a first vision source, a second vision source, and an image generator ('IG'). The first vision source may be could configured to generate a first image data set and a depth buffer data set, and the second vision data source could configured to generate a second image data set. The IG could be configured to receive both the first and second image data sets; the depth buffer data set; and generate a third image data set as a function of both image data sets, the depth buffer data set, and a pixel cutoff distance that may be fixed or variable. In addition, the pixel cutoff distance may be determined as a function of input variable data.


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