The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Jan. 22, 2013
Applicants:

Michael C. Meholensky, Marion, IA (US);

Vadim Olen, Cedar Rapids, IA (US);

Adrian A. Hill, Vinton, IA (US);

Paul L. Opsahl, Cedar Rapids, IA (US);

Inventors:

Michael C. Meholensky, Marion, IA (US);

Vadim Olen, Cedar Rapids, IA (US);

Adrian A. Hill, Vinton, IA (US);

Paul L. Opsahl, Cedar Rapids, IA (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/091 (2006.01); H03B 5/32 (2006.01); H03L 1/02 (2006.01); H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
H03L 7/06 (2013.01);
Abstract

Disclosed are control systems, and more specifically control systems which benefit from a long-gate time for measurement and a rapid sample time to enhance responsiveness and methods and systems for utilizing multiple-staggered, overlapping gates where the gate time is an integer multiple of the time between ends of adjacent gates. The system continuously counts at the wavefronts or zero-crossings of a frequency reference signal and temporarily records them in registers and compares the contents of registers separated by a gate time and outputs a sample after every sample time.


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