The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Sep. 09, 2014
Applicant:

Gembedded Tech Ltd., Tortola, VG;

Inventor:

Chi-Tsai Chen, Taichung, TW;

Assignee:

Gembedded Tech Ltd., Road Town, Tortola, VG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01); H01L 27/115 (2006.01); H01L 29/94 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11558 (2013.01); H01L 29/94 (2013.01);
Abstract

A single-poly NVM cell includes a substrate having an isolation region separating a first OD region from a second OD region, a read transistor within the first OD region, and a coupling capacitor within the second OD region. A first ion well completely overlaps with the first oxide define region. The read transistor includes a drain region, a source region, a channel region, a single-poly floating gate overlying the channel region, and a gate dielectric layer between the floating gate and the channel region. The coupling capacitor includes a shallow ion well, a heavily-doped, ultra-shallow dopant region in the shallow ion well, a single-poly charge-storage floating gate overlying the heavily-doped, ultra-shallow dopant region, and a gate dielectric layer under the charge storage floating gate. The shallow ion well has a junction depth that is substantially equal to or shallower than a trench depth of the isolation region.


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