The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Jun. 09, 2008
Applicants:

Shazi Iqbal, Danville, CA (US);

Steven M. Montgomery, Los Angeles, CA (US);

Ronald Chang, Redwood City, CA (US);

Gregory Mote, Los Angeles, CA (US);

Douglas B Dority, Santa Cruz, CA (US);

Jeffrey S. Ross, Lebanon Springs, NY (US);

Inventors:

Shazi Iqbal, Danville, CA (US);

Steven M. Montgomery, Los Angeles, CA (US);

Ronald Chang, Redwood City, CA (US);

Gregory Mote, Los Angeles, CA (US);

Douglas B Dority, Santa Cruz, CA (US);

Jeffrey S. Ross, Lebanon Springs, NY (US);

Assignee:

SYFR, Inc., Danville, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/30 (2006.01); G01N 35/00 (2006.01); G01N 1/31 (2006.01); C12M 1/02 (2006.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00029 (2013.01); G01N 1/30 (2013.01); G01N 1/312 (2013.01); G01N 2035/00811 (2013.01); G01N 1/38 (2013.01); G01N 2001/386 (2013.01); G01N 2035/00534 (2013.01); G01N 35/0092 (2013.01); G01N 2035/00792 (2013.01);
Abstract

Provided is a system and method for staining of one or more samples, including providing one or more self-contained sample processing receptacles, each of the one or more self-contained sample processing receptacles configured to be inserted into an auto-staining instrument; and enabling one of one or more staining procedures appropriate for the one or more samples as a function of a choice of self-contained sample processing receptacle, each of the one or more self-contained sample processing receptacles configured to process each inserted sample of the one or more samples within the self-contained sample processing receptacle.


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