The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Jul. 18, 2012
Ryan G. Dejana, Longmont, CO (US);
Lisa Seacat Deluca, San Francisco, CA (US);
Soobaek Jang, Hamden, CT (US);
Ryan G. DeJana, Longmont, CO (US);
Lisa Seacat DeLuca, San Francisco, CA (US);
Soobaek Jang, Hamden, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present invention relate to an integrated development environment (IDE)-based approach for testing development projects (e.g., comprising one or more intended workloads). In a typical embodiment, a designation of a project (e.g. having a set of workloads) for testing on a network resource group is received via a user interface associated with an IDE. A current server instance in the network resource group having a highest availability for testing the project may then be identified (e.g., based on an analysis of various computing/cost characteristics). The project may then be deployed to the current server instance, and a network address corresponding to the current server instance may be associated with the project in a computer storage device. The project may then be tested by processing the set of intended workloads using the current server instance.