The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Nov. 13, 2012
International Business Machines Corporation, Armonk, NY (US);
Jonathan Bnayahu, Haifa, IL;
Maayan Goldstein, Haifa, IL;
Dany Moshkovich, Haifa, IL;
Moti Nisenson, Haifa, IL;
Yahalomit Simionovici, Haifa, IL;
Shmuel Ur, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method that includes: running a set of functional tests over a computer code; determining, for each code element of the computer code, which functional test covered it, to yield a tests-elements coverage map; associating portions of the computer code with corresponding design portions or requirements derived from a design document or a requirements document respectively, associated with the computer code, to yield a design/requirements-code tracing map; deriving, from the tests-code coverage map and the design/requirements-code tracing map, a design/requirements-tests coverage map, exhibiting coverage of the computer code by the functional tests, in terms of the design or the requirements, wherein at least one of the running, the determining, the associating, and the deriving is executed by at least one processor.