The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Mar. 31, 2009
Sivarudrappa Mahesh, Redmond, WA (US);
Kinshumann Kinshumann, Redmond, WA (US);
Kripashankar Mohan, Redmond, WA (US);
Shlok Bidasaria, Redmond, WA (US);
Sivarudrappa Mahesh, Redmond, WA (US);
Kinshumann Kinshumann, Redmond, WA (US);
Kripashankar Mohan, Redmond, WA (US);
Shlok Bidasaria, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A flexible system for collecting and reporting instrumentation metrics relating to performance of a software product. Computing devices that execute the software product receive a manifest that specifies the manner in which instrumentation metrics are collected and reported, including what instrumentation metrics are collected. Based on the manifest, an instrumentation metrics client associated with a software product may retrieve instrumentation data from a software product or other sources. The metrics client may then generate one or more instrumentation metrics, based on the instrumentation data, in accordance with instructions in the manifest. The metrics client may then take one or more actions based on the instrumentation metrics and the manifest, such as reporting the information to an instrumentation metrics server for aggregation and analysis by the metrics server or performing escalation actions that can modify the metrics collected and reported.