The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Feb. 17, 2011
Applicants:

Milind Naphade, Fishkill, NY (US);

Sambit Sahu, Hopewell Junction, NY (US);

Jing Dai, White Plains, NY (US);

Inventors:

Milind Naphade, Fishkill, NY (US);

Sambit Sahu, Hopewell Junction, NY (US);

Jing Dai, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 15/18 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06F 15/18 (2013.01); G06N 99/005 (2013.01);
Abstract

A method of generating analytics to provide an analysis of data from distinct data domains includes collecting sensor data from at least two distinct data domains, deriving parameters from the collected data, wherein at least one of the parameters is a first domain parameter derived from one of the data domains and at least another one of the parameters is a second domain parameter derived from the other data domain, providing a data model that enables a user to specify at least one of the first parameters and at least one of the second domain parameters and generate at least one rule based on the selected parameters, and generating analytics that analyze the collected data against the rules to determinate whether the rules have been satisfied and provide results of the analysis to a user of the analytics.


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