The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Mar. 13, 2013
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Christina Pavlopoulou, Menlo Park, CA (US);

Evgeniy Bart, Sunnyvale, CA (US);

Eric Saund, San Carlos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3053 (2013.01);
Abstract

A method is provided for parsing a document having a plurality of lines on which items are listed spanning one or more lines. It includes: obtaining a plurality of candidates, representing hypothetical items within the document, each candidate spanning one or more lines and having a local cost representing a confidence in a quality of the candidate compared to a model; determining labeling costs for intervals of the document defined between pairs of lines, each interval containing candidates therein, each labeling cost reflecting a configuration of the candidates within the interval; identifying a best labeling for each interval based on the labeling costs determined for that interval, the best labeling corresponding to one of the configurations of the candidates within the interval; defining a global objective function; and selecting a subset of the candidates such that the global objective function is optimized, based on the identified best labelings.


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