The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Sep. 29, 2003
Applicants:
Shyh-kwei Chen, Chappaqua, NY (US);
Kun-lung Wu, Yorktown Heights, NY (US);
Philip Shi-lung Yu, Chappaqua, NY (US);
Inventors:
Shyh-Kwei Chen, Chappaqua, NY (US);
Kun-Lung Wu, Yorktown Heights, NY (US);
Philip Shi-lung Yu, Chappaqua, NY (US);
Assignee:
International Business Machines Corporaton, Armonk, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30516 (2013.01); G06F 17/3046 (2013.01);
Abstract
A method (and structure) for monitoring continual range queries against events includes decomposing each range query with one or more predefined virtual constructs, building a query index, and using the query index to match an event with the range queries.