The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

May. 13, 2013
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventor:

Hiroki Nakayama, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30371 (2013.01);
Abstract

A system includes a unit to generate a set of free itemsets with a frequency in a database greater than or equal to a threshold value, a unit to generate a rule candidate with, a conditional part set to the free itemset α, and a consequent part set to an item x not sharing an attribute with the free itemset, and finds a set of attributes of an antecedent part of the rule by depth first search, the attribute not included in neither α nor x, a unit to collate the rule to the database to judge validity of the rule, and a unit to check for minimality of the rule decided to be valid to output the rule when the rule is minimal.


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