The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Mar. 12, 2012
Applicants:

Justin D. Kearns, Seattle, WA (US);

Manny Salazar Urcia, Jr., Bellevue, WA (US);

Christopher Lee Davis, Maple Valley, WA (US);

Clarence L. Gordon, Iii, Renton, WA (US);

Inventors:

Justin D. Kearns, Seattle, WA (US);

Manny Salazar Urcia, Jr., Bellevue, WA (US);

Christopher Lee Davis, Maple Valley, WA (US);

Clarence L. Gordon, III, Renton, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for identifying deformation of a structure. Training deformation data is identified for each training case in a plurality of training cases. Training strain data is identified for each training case in the plurality of training cases. The training deformation data and the training strain data are configured for use by a heuristic model to increase an accuracy of output data generated by the heuristic model. A group of parameters for the heuristic model is adjusted using the training deformation data and the training strain data for the each training case in the plurality of training cases such that the heuristic model is trained to generate estimated deformation data for the structure based on input strain data. The estimated deformation data has a desired level of accuracy.


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