The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Oct. 31, 2011
Ming C Hao, Palo Alto, CA (US);
Umeshwar Dayal, Saratoga, CA (US);
Manish Marwah, Palo Alto, CA (US);
Daniel Keim, Steiβlingen, DE;
Halldor Janetzko, Baden-Wittenberg, DE;
Ming C Hao, Palo Alto, CA (US);
Umeshwar Dayal, Saratoga, CA (US);
Manish Marwah, Palo Alto, CA (US);
Daniel Keim, Steiβlingen, DE;
Halldor Janetzko, Baden-Wittenberg, DE;
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Multivariate time-series prediction is combined with motif discovery. Multivariate time-series prediction is performed on measured (past) data points to generate or determine predicted data points. One or more motifs are discovered or determined within the combined measured data points and the predicted data points. The motifs within the measured data points are associated with the motifs within the predicted data points to permit inferences of the motifs within the measured data points to be applied to the motifs within the predicted data points. The measured data points, the predicted data points, and the motifs are displayed. User interaction with this display of the measured data points, the predicted data points, and the motifs is permitted.