The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Mar. 30, 2011
Applicants:

Zafer Sahinoglu, Boston, MA (US);

Ming Sun, Sunnyvale, CA (US);

Koon Hoo Teo, Lexington, MA (US);

Inventors:

Zafer Sahinoglu, Boston, MA (US);

Ming Sun, Sunnyvale, CA (US);

Koon Hoo Teo, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/02 (2006.01); G01R 25/00 (2006.01); H02J 13/00 (2006.01); G06F 19/00 (2011.01); G06F 17/40 (2006.01); G01R 23/15 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 23/15 (2013.01); G01R 23/02 (2013.01); H02J 13/00 (2013.01); G06F 17/40 (2013.01); G06F 19/00 (2013.01); G01R 19/2513 (2013.01); G01R 25/00 (2013.01);
Abstract

At least one parameter of a signal is determined, wherein the signal is a sinusoidal signal including noise, wherein the parameter includes at least one of a frequency of the signal, and an angle of a phase of the signal. The frequency of the signal is determined iteratively based on a linear relationship among the frequency of the signal, samples of the noise, and samples of the signal using a statistical correlation among the samples of the noise. During a current iteration the statistical correlation is updated based on the frequency of the signal determined during a previous iteration, and the samples of the signal are updated with values of the signal during a current period of time.


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