The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Jan. 26, 2012
Chad Martin Shaffer, State College, PA (US);
Peter Renzel, Münsterweg, DE;
Jerome Poirier, Forges les Bains, FR;
Michael Maria Berke, Cologne, DE;
Douglas Paul Lutz, Lewistown, PA (US);
Rai Mohan Dasarathan, Bangalore, IN;
Anandamurugan S, Bangalore, IN;
Chad Martin Shaffer, State College, PA (US);
Peter Renzel, Münsterweg, DE;
Jerome Poirier, Forges les Bains, FR;
Michael Maria Berke, Cologne, DE;
Douglas Paul Lutz, Lewistown, PA (US);
Rai Mohan Dasarathan, Bangalore, IN;
Anandamurugan S, Bangalore, IN;
General Electric Company, Schenectady, NY (US);
Abstract
A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.