The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Jan. 31, 2011
Henry W. Posamentier, The Woodlands, TX (US);
Cung Khac VU, Houston, TX (US);
James P. Disiena, Houston, TX (US);
Todd Dygert, Kingwood, TX (US);
Henry W. Posamentier, The Woodlands, TX (US);
Cung Khac Vu, Houston, TX (US);
James P. DiSiena, Houston, TX (US);
Todd Dygert, Kingwood, TX (US);
Chevron U.S.A. Inc., San Ramon, CA (US);
Abstract
Geologic information may be extracted from multiple offset stacks and/or angle stacks. Offset stacks and/or angle stacks may be received that represent energy that has propagated through a geologic volume of interest from energy sources to energy receivers. Attribute volumes associated with individual source-receiver offsets and/or source-receiver angles may be determined based on corresponding offset stacks and/or angle stacks. For individual offset stacks or angle stacks, corresponding sets of geologic features represented in the attribute volumes may be identified. The sets of geologic features corresponding to the different offset stacks and/or angle stacks to may be compared to determine discrepancies and/or similarities between the sets of geologic features corresponding to the different offset stacks and/or angle stacks. Stratigraphic interpretations, stratigraphic predictions, and/or other interpretations and/or predictions may be determined based on causes of the discrepancies and/or similarities.