The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Oct. 23, 2007
Applicants:

Patrick D. Pannese, Lynnfield, MA (US);

Vinaya Kavathekar, Cupertino, CA (US);

Peter Van Der Meulen, Newburyport, MA (US);

Inventors:

Patrick D. Pannese, Lynnfield, MA (US);

Vinaya Kavathekar, Cupertino, CA (US);

Peter van der Meulen, Newburyport, MA (US);

Assignee:

Brooks Automation, Inc., Chelmsford, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 19/00 (2011.01); G05B 99/00 (2006.01); G05B 15/02 (2006.01); G05B 19/418 (2006.01); G05B 23/02 (2006.01); G06T 7/00 (2006.01); H01L 21/67 (2006.01); H01L 21/677 (2006.01);
U.S. Cl.
CPC ...
G05B 99/00 (2013.01); G05B 15/02 (2013.01); G05B 19/41865 (2013.01); G05B 19/41885 (2013.01); G05B 23/0267 (2013.01); G06T 7/0004 (2013.01); H01L 21/67161 (2013.01); H01L 21/67184 (2013.01); H01L 21/6719 (2013.01); H01L 21/67196 (2013.01); H01L 21/67201 (2013.01); H01L 21/67207 (2013.01); H01L 21/67742 (2013.01); H01L 21/67745 (2013.01); G05B 2219/31467 (2013.01); G05B 2219/31472 (2013.01); G05B 2219/32128 (2013.01); G05B 2219/32267 (2013.01); G05B 2219/32329 (2013.01); G05B 2219/32335 (2013.01); G05B 2219/32342 (2013.01); G05B 2219/32351 (2013.01); G05B 2219/35494 (2013.01); G05B 2219/45031 (2013.01); G05B 2219/30 (2013.01); G05B 2219/31 (2013.01); G05B 2219/40411 (2013.01); G05B 2219/40412 (2013.01); G05B 2219/40413 (2013.01); G05B 2219/40419 (2013.01); G05B 2219/40424 (2013.01);
Abstract

Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.


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