The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Dec. 21, 2012
Applicants:
K. M. K. Genghis Khan, Schenectady, NY (US);
Chandra Sekher Yerramalli, Raleigh, NC (US);
Inventors:
K. M. K. Genghis Khan, Schenectady, NY (US);
Chandra Sekher Yerramalli, Raleigh, NC (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); A61B 8/08 (2006.01); G01R 33/563 (2006.01); A61B 5/00 (2006.01); A61B 6/00 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); G01R 33/56358 (2013.01); A61B 8/485 (2013.01); A61B 8/5207 (2013.01); A61B 5/0048 (2013.01); A61B 6/48 (2013.01); A61B 6/5205 (2013.01); A61B 8/0825 (2013.01); A61B 8/085 (2013.01); A61B 8/467 (2013.01);
Abstract
Nonlinear elastography systems and methods are provided. The elastography system includes a data acquisition module, such as an imaging device, and associated system control circuitry. The data acquisition module is configured to acquire various data, such as displacement and/or force data, from a material. A nonlinear transfer function is applied to the acquired data to generate information about the material's stiffness. In one implementation, a map representative of the material's stiffness is generated.