The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Apr. 16, 2009
Applicants:

Emmanuel Le Taillandier DE Gabory, Tokyo, JP;

Kiyoshi Fukuchi, Tokyo, JP;

Inventors:
Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/00 (2006.01); H04B 10/077 (2013.01); H04L 25/14 (2006.01); H04J 14/04 (2006.01); H04J 14/02 (2006.01); H04L 7/00 (2006.01); H04J 3/06 (2006.01);
U.S. Cl.
CPC ...
H04B 10/0775 (2013.01); H04L 25/14 (2013.01); H04J 14/04 (2013.01); H04J 14/02 (2013.01); H04L 7/0075 (2013.01); H04J 3/0658 (2013.01);
Abstract

A method is provided for detecting the skew between parallel light signals generated from a serial data stream. The method can be used with polarization multiplexed signal, as well as with wavelength division multiplexed signals, spatial division multiplexed signals, phase modulated signals, or intensity modulated signals. The method can be used with direct detection schemes as well as with coherent detection schemes. The method is provided with: imprinting dips between a fixed number of transmitted symbols of the parallel signals; detecting an electrical signal related to the dips for each parallel signal; and comparing the electrical signals in delay.


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