The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Jul. 16, 2012
Applicant:

Dominique Rivard, Pierrefonds, CA;

Inventor:

Dominique Rivard, Pierrefonds, CA;

Assignee:

Matrox Electronic Systems Ltd., Dorval, QC, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for identifying an edge in a portion of an image, the portion having an associated intensity variation. An edge candidate is detected at a local extremum of the intensity variation (i.e. at a position along the x-axis that corresponds to a peak or valley of the intensity variation). A local threshold associated with the edge candidate is computed on the basis of a slope tolerance and the slope value of the edge candidate, where this local threshold defines a boundary region for the edge candidate. If the edge candidate is determined to be a global extremum (i.e. the highest peak or lowest valley) within its respective boundary region, the edge candidate is verified as being an actual edge of the image portion. Identification of this verified edge may include determination of one or more of a plurality of characteristics of the edge.


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