The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Oct. 26, 2013
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Peter Charles Barnum, Berkeley, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06T 7/2013 (2013.01); G06T 7/2073 (2013.01); G06T 2207/20016 (2013.01);
Abstract

A method for approximate pyramidal search for displacement matching is provided that includes performing a complete window-based search at a coarsest resolution level in a resolution pyramid to determine a best matching point in a destination image for each point in a source image, wherein a displacement from each point to the best matching point is determined, counting, for each displacement of the determined displacements, a number of points having the displacement, selecting displacements from the determined displacements based on the number of points counted for each displacement and a predetermined threshold, and performing a search at the next finer resolution level in the resolution pyramid to determine a best matching point in the destination image for each point in the source image, wherein the search for a best matching point for each point is limited to the selected displacements and a reduced search window around each displacement.


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