The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Apr. 29, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Mitsuhiro Inazumi, Shiojiri, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); G06K 19/06 (2006.01); G06K 7/10 (2006.01); G06K 7/14 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1443 (2013.01); G06K 9/4604 (2013.01); G06K 19/06037 (2013.01);
Abstract
A marker processing method includes: (a) binarizing a shot image; (b) labeling one or more constituents of the image detected based on the image binarized in step (a); (c) obtaining a region centroid of each of the constituents corresponding to the respective labels processed in step (b); (d) obtaining a degree of overlap of the region centroids of the constituents corresponding respectively to the labels, obtained in step (c); and (e) detecting a marker based on the degree of overlap of the region centroids obtained in step (d).