The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Dec. 01, 2009
Applicants:

Christopher A. Parham, Raleigh, NC (US);

Zhong Zhong, Stony Brook, NY (US);

Etta Pisano, Chapel Hill, NY (US);

Dean M. Connor, Jr., Mount Pleasant, SC (US);

Inventors:

Christopher A. Parham, Raleigh, NC (US);

Zhong Zhong, Stony Brook, NY (US);

Etta Pisano, Chapel Hill, NY (US);

Dean M. Connor, Jr., Mount Pleasant, SC (US);

Assignees:

The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);

NextRay, Inc., Chapel Hill, NC (US);

Brookhaven Science Associates, Upton, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/04 (2006.01); A61B 6/03 (2006.01); G01N 23/04 (2006.01); G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4092 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4042 (2013.01); A61B 6/4488 (2013.01); A61B 6/482 (2013.01); A61B 6/502 (2013.01); A61B 6/5282 (2013.01); A61B 6/542 (2013.01); G01N 23/046 (2013.01); G01T 1/00 (2013.01); G21K 2201/062 (2013.01); A61B 6/4021 (2013.01);
Abstract

Systems and methods for detecting an image of an object using a multi-beam imaging system from an x-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a plurality of monochromator crystals in a predetermined position to directly intercept the first X-ray beam such that a plurality of second X-ray beams having predetermined energy levels are produced. Further, an object can be positioned in the path of the second X-ray beams for transmission of the second X-ray beams through the object and emission from the object as transmitted X-ray beams. The transmitted X-ray beams can each be directed at an angle of incidence upon one or more crystal analyzers. Further, an image of the object can be detected from the beams diffracted from the analyzer crystals.


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