The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Nov. 21, 2012
Xinray Systems Inc., Research Triangle Park, NC (US);
Moritz Beckmann, Cary, NC (US);
Frank Sprenger, Cary, NC (US);
Yuan Cheng, Durham, NC (US);
Jianping Lu, Chapel Hill, NC (US);
Derrek Spronk, Raleigh, NC (US);
George Zarur, Gainesville, FL (US);
Otto Z. Zhou, Chapel Hill, NC (US);
XinRay Systems Inc, Research Triangle Park, NC (US);
Abstract
The present subject matter relates to inspection systems, devices and methods for x-ray inspection of objects. A conveyor can move an object to be inspected through an inspection zone along a direction of travel, one or more multibeam x-ray source arrays can provide multiple collimated x-ray beams through the inspection zone along a direction substantially perpendicular to the direction of travel, and one or more x-ray detector arrays can detect x-ray beams passing through the inspection zone from the x-ray source array. X-ray signals detected by the x-ray detector array can be recorded to form multiple x-ray projection images of the object, and the multiple x-ray projection images can be processed into three-dimensional tomographic images of the object.