The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Oct. 28, 2013
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventor:

Paolo Novellini, Gorgonzola, IT;

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0091 (2013.01);
Abstract

The methods and apparatus disclosed herein provide an operative system for increasing the resolution of serial DRUs based on interleaved free running oversamplers. In particular, this system uses incoming data to measure and to compensate the skew between two or more free running oversamplers (e.g., SerDes), without the need for any hardware design requirement relating to the precision of the relative skew of the oversamplers.


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