The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Feb. 25, 2011
Applicants:

Jonas Fölling, Heidelberg, DE;

Marcus Dyba, Heidelberg, DE;

Inventors:

Jonas Fölling, Heidelberg, DE;

Marcus Dyba, Heidelberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/26 (2013.01);
Abstract

A sample retainer for a microscope is described, comprising a sample stage (), a holder () arranged on the sample stage (), a sample carrier (), couplable to the holder (), to which a sample is attachable, and an adjusting apparatus (), engaging on the holder (), with which with the sample carrier (), together with the holder () to which the sample carrier () is coupled, is displaceable on the sample stage (), relative to the objective (), into a target position. A decoupling apparatus that decouples the sample carrier (), arranged in the target position, from the holder () upon imaging of the sample through the objective () is provided.


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