The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Nov. 15, 2012
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventor:
Hyun Woo Song, Daejeon, KR;
Assignee:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/55 (2014.01); G01N 21/21 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 21/21 (2013.01); G01N 21/4795 (2013.01);
Abstract
Disclosed is an optical constant measuring method which includes applying light to a sample including a target material; measuring a first optical signal from light reflected from the sample; grasping a structure of the sample based on the first optical signal; measuring a second optical signal from light penetrating the sample; grasping an overall optical property of the sample based on the second optical signal; and measuring an optical constant of the target material based on the measured structure and optical property of the sample.