The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Dec. 13, 2013
Inview Technology Corporation, Austin, TX (US);
Matthew A. Herman, Austin, TX (US);
Donna E. Hewitt, Austin, TX (US);
Tyler H. Weston, Austin, TX (US);
Lenore McMackin, Austin, TX (US);
In View Technology Corporation, Austin, TX (US);
Abstract
A mechanism for reconstructing sub-images based on measurement data acquired by an imaging system including an array of light modulating elements and an array of photodetectors. Each sub-image is reconstructed based on samples from a respective photodetector and a respective set of measurement patterns defined on a respective virtual sub-region on the modulating array. Each virtual sub-region is configured to include at least the light modulating elements that are able to send a non-trivial amount of light to the respective photodetector during a pattern application period. The virtual sub-regions overlap because many light modulating elements are capable of sending light to more than one photodetector. Whenever a measurement pattern of one virtual sub-region overlaps the measurement pattern of a neighboring virtual sub-region, the two measurement patterns agree by design. Thus, the measurement patterns for the collection of virtual sub-regions combine to form a pattern on the whole modulating array.