The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Sep. 27, 2010
Applicants:
Myron H. Gentrup, San Jose, CA (US);
Icko E. T. Iben, Santa Clara, CA (US);
John T. Kinnear, Jr., Lagrangeville, NY (US);
Inventors:
Myron H. Gentrup, San Jose, CA (US);
Icko E. T. Iben, Santa Clara, CA (US);
John T. Kinnear, Jr., Lagrangeville, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G11B 5/455 (2006.01); G01R 29/08 (2006.01); G11B 5/31 (2006.01); G11B 5/60 (2006.01);
U.S. Cl.
CPC ...
G01R 31/001 (2013.01); G11B 5/455 (2013.01); G01R 29/0814 (2013.01); G11B 5/3166 (2013.01); G11B 5/6094 (2013.01);
Abstract
An audit device according to one embodiment includes a substrate; at least one test element coupled to the substrate; a connector adapted for coupling the at least one test element to leads of a cable; and a probe for detecting at least one of: voltage across and current through the at least one test element. Additional systems and methods are also presented.