The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Jul. 17, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hideaki Nishiuchi, Tokyo, JP;

Koji Tobinaga, Hitachi, JP;

Kunio Moriyama, Tokyo, JP;

Takuya Nomura, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H 13/04 (2006.01); A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1067 (2013.01); A61N 2005/1074 (2013.01); A61N 2005/1087 (2013.01);
Abstract

A control data about the devices constituting the synchrotron are formed by an initial acceleration control data item, a plural extraction control data items, a plural energy change control data items connecting the plural extraction control data items, and a plural deceleration control data items corresponding to the plural extraction control data items. An affected part position detection unit and an extraction permission determination unit are provided to determine whether the position of a marker shown in transparent image information is included within a beam irradiation permission range. If the marker position is found included, the extraction permission determination unit outputs to an interlock system an extraction permission determination signal permitting beam extraction.


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