The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Feb. 26, 2013
Applicant:

Omron Corporation, Kyoto-shi, JP;

Inventors:

Toshinori Sato, Ritto, JP;

Akihiko Morikawa, Kyoto, JP;

Takao Ushiyama, Ritto, JP;

Junichi Ueno, Otsu, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/34 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G01D 5/34 (2013.01); G01D 5/24466 (2013.01);
Abstract

A signal output unit generates an A phase output signal of a rectangular wave and a B phase output signal of a rectangular wave from the A phase sinusoidal wave signal and the B phase sinusoidal wave signal, respectively and outputs the generated signals. An internal signal generating unit (comparator) generates an A phase internal signal of a rectangular wave and a B phase internal signal of a rectangular wave from the A phase sinusoidal wave signal and the B phase sinusoidal wave signal, respectively, which are further processed by counters, and an abnormality detector. Each counter resets in response to a pulse edge of a signal for detection. The abnormality detector detects an abnormality when the count value of at least one of counters reaches a prescribed value.


Find Patent Forward Citations

Loading…