The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

May. 16, 2012
Applicants:

Nicolas Savoire, Mouans-Sartoux, FR;

Tom Vercauteren, Paris, FR;

Inventors:

Nicolas Savoire, Mouans-Sartoux, FR;

Tom Vercauteren, Paris, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G06T 5/20 (2006.01); G02B 21/36 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G02B 21/365 (2013.01); G06T 5/008 (2013.01); G06T 5/006 (2013.01); G06T 2207/10056 (2013.01);
Abstract

A method for processing images acquired by image detectors with non-uniform transfer functions and irregular spatial locations includes the steps of accumulating data from multiple images, defining an affinity graph which edges define pairs of detectors that measure related signal, performing statistical analysis on the accumulated data with respect to each pair of detectors, and solving a system of equations constructed from the results of the statistical analysis to estimate each detector transfer function, a set of solutions to the system of equations comprising a calibration of an imaging system.


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