The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Sep. 07, 2011
Applicants:
Dongsoo Kim, San Jose, CA (US);
Sungkuk Hong, Santa Clara, CA (US);
Kwangbo Cho, San Jose, CA (US);
Inventors:
Assignee:
Semiconductor Components Industries, LLC, Phoenix, AZ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G01J 1/44 (2006.01); H03K 21/38 (2006.01); H04N 5/357 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); H03K 21/38 (2013.01); H04N 5/3575 (2013.01); H04N 5/378 (2013.01);
Abstract
Apparatus and a method for correlated double sampling using an up-counter for parallel image sensors. All bits of a counter are set to one. An offset signal is compared to a first reference signal to define a first period during which the counter is incremented. After the first period, all bits of the counter are inverted. A sensor signal is compared to a second reference signal to define a second period during which the counter is incremented to generate a correlated double sampling value.